|賞名||19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductor (DRIP XIX) Young Researcher Award|
|研究課題||Identifying edge-component Burgers vector of threading dislocations in SiC crystals by birefringence imaging|
A brief introduction of the presentation
Theoretical consideration and experimental demonstration revealed that contrast variation of birefringence image in an off-axis SiC wafer corresponds to the in-plane shear stress field, which enables us to identify the edge-component Burgers vector of threading dislocations in SiC wafers.
Message from the YRA winner
I am very honored to join DRIP XIX conference and receive the Young Researcher Award.
Everything in the conference including discussion with the participants and listening to the presentation is a totally happy time.
I greatly appreciate the collaborators in my research, and the participants and the committee members of DRIP XIX.