| 受賞日 | 2022/09/01 |
|---|---|
| 賞名 | 19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductor (DRIP XIX) Young Researcher Award |
| 受賞者 | 原田 俊太（准教授） |
| 研究課題 | Identifying edge-component Burgers vector of threading dislocations in SiC crystals by birefringence imaging |
| 関連HP |
https://confit.atlas.jp/guide/event/drip19/static/YRA |
A brief introduction of the presentationTheoretical consideration and experimental demonstration revealed that contrast variation of birefringence image in an off-axis SiC wafer corresponds to the in-plane shear stress field, which enables us to identify the edge-component Burgers vector of threading dislocations in SiC wafers.
Message from the YRA winner
I am very honored to join DRIP XIX conference and receive the Young Researcher Award.
Everything in the conference including discussion with the participants and listening to the presentation is a totally happy time.
I greatly appreciate the collaborators in my research, and the participants and the committee members of DRIP XIX.（転載）
