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Associate Prof. Shunta Harada received 19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductor (DRIP XIX) Young Researcher Award.

Award date 2022/09/01
Award 19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductor (DRIP XIX) Young Researcher Award
Winner Shunta Harada (Associate Professor)
Research topics Identifying edge-component Burgers vector of threading dislocations in SiC crystals by birefringence imaging
Related HP https://confit.atlas.jp/guide/event/drip19/static/YRA
Ujihara Lab.
https://ujihara.material.nagoya-u.ac.jp/
A brief introduction of the presentation

Theoretical consideration and experimental demonstration revealed that contrast variation of birefringence image in an off-axis SiC wafer corresponds to the in-plane shear stress field, which enables us to identify the edge-component Burgers vector of threading dislocations in SiC wafers.

 

Message from the YRA winner

I am very honored to join DRIP XIX conference and receive the Young Researcher Award.
Everything in the conference including discussion with the participants and listening to the presentation is a totally happy time.
I greatly appreciate the collaborators in my research, and the participants and the committee members of DRIP XIX.
(Reprint)