In this section, techniques for detailed structural analyses and property measurements using electron microscopes are developed; precise measurement of lattice strain in the nanometer range using convergent beam electron diffraction (CBED); three-dimensional structural analysis through electron tomography; visualization of electromagnetic fields and local strains using 4D-STEM technology with newly introduced detectors; operando observation and analysis of chemical reactions under gas environments; and time-resolved observation and analysis using pulsed electron beams.

Reaction Science Ultra-High Voltage Scanning Transmission Electron Microscope JEM1000K RS