In this section, techniques for detailed structural analyses and property measurements using electron microscopes are developed. Topics include atomic-level analysis of spatial and electronic structures, precise measurements of nanoscale lattice distortions using convergent beam electron diffraction, three-dimensional structural analysis with electron beam tomography, visualization of electromagnetic fields using electron holography, and operando measurements/observation of chemical reactions under different gas environments.

Electron Nanoscopy Section (Muto Lab.)

Electron Beam Physics (Saito Lab.)

Reaction Science Ultra-High Voltage Scanning Transmission Electron Microscope JEM1000K RS